Texas Instruments 邏輯-專業邏輯
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類別半導體 / 邏輯IC / 邏輯-專業邏輯
制造商
記錄 422
頁面 11/15
圖片 |
型號 |
制造商 |
描述 |
庫存 |
數量 |
系列 | 邏輯類型 | 電源電壓 | 位數 | 工作溫度 | 安裝類型 | 包裝/箱 | 供應商設備包裝 |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
8,532 |
|
74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
|
|
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
3,996 |
|
74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
|
|
Texas Instruments |
IC FULL ADDER 4BIT BIN 16-SOIC |
4,410 |
|
74F | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC |
|
|
Texas Instruments |
IC FULL ADDER 4BIT BIN 16SO |
5,958 |
|
74F | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO |
|
|
Texas Instruments |
IC FULL ADDER 4BIT BIN 16SO |
3,348 |
|
74F | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO |
|
|
Texas Instruments |
IC TXRX ADDRESS/DATA 9BIT 52-QFP |
1,332 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 9 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX ADDRESS/DATA 9BIT 52-QFP |
6,660 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 9 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
4,428 |
|
74FB | TTL/BTL Registered Transceiver | 4.75V ~ 5.25V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
5,184 |
|
74FB | TTL/BTL Registered Transceiver | 4.75V ~ 5.25V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX 8BIT TTL/BTL 52-QFP |
7,110 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX 8BIT TTL/BTL 52-QFP |
4,680 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX 7BIT TTL/BTL 52-QFP |
48 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX 7BIT TTL/BTL 52-QFP |
3,490 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX 7BIT TTL/BTL 52-QFP |
2,466 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
8,856 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
4,896 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
8,442 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
6,570 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
7,992 |
|
74ABT | Scan Test Device with Universal Bus Transceivers | 4.5V ~ 5.5V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 20BIT 64LQFP |
4,716 |
|
74ABT | Scan Test Device with Universal Bus Transceivers | 4.5V ~ 5.5V | 20 | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
19 |
|
74ABT | Scan Test Device with Inverting Bus Transceivers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 18BIT 56SSOP |
7,056 |
|
74ABT | Scan Test Device with Inverting Bus Transceivers | 4.5V ~ 5.5V | 18 | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
2,790 |
|
74ABT | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
7,434 |
|
74ABT | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
2,358 |
|
74ABT | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
3,816 |
|
74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
4,536 |
|
74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
8,856 |
|
74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
5,562 |
|
74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
|
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SOIC |
4,590 |
|
74ABT | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC |